Error analysis and compensation of binocular-stereo-vision measurement systemZHANG TAO; GUO JUNJIE.Proceedings of SPIE, the International Society for Optical Engineering. 2008, Vol 7155, pp 71552Q.1-71552Q.9, issn 0277-786X, isbn 978-0-8194-7398-1 0-8194-7398-7, 2Conference Paper

Fast auto-focusing based on partial image characteristicsCUI JIWEN; TAN JIUBIN.Proceedings of SPIE, the International Society for Optical Engineering. 2008, Vol 7155, pp 71550O.1-71550O.10, issn 0277-786X, isbn 978-0-8194-7398-1 0-8194-7398-7, 2Conference Paper

Precision optical metrology for MEMSPRYPUTNIEWICZ, Ryszard J.Proceedings of SPIE, the International Society for Optical Engineering. 2008, Vol 7155, pp 71551S.1-71551S.10, issn 0277-786X, isbn 978-0-8194-7398-1 0-8194-7398-7, 2Conference Paper

Ultra-thin film characterization with vacuum ultraviolet spectroscopic reflectometry (VUV-SR)BURKI, Ibrahim; RIVAS, Cristian.Proceedings of SPIE, the International Society for Optical Engineering. 2008, Vol 7155, pp 71552E.1-71552E.11, issn 0277-786X, isbn 978-0-8194-7398-1 0-8194-7398-7, 2Conference Paper

Ninth International Symposium on Laser Metrology (30 June - 2 July 2008, Singapore)Quan, Chenggen; Asundi, Anand.Proceedings of SPIE, the International Society for Optical Engineering. 2008, Vol 7155, issn 0277-786X, isbn 978-0-8194-7398-1 0-8194-7398-7, 2 vol, 2, isbn 978-0-8194-7398-1 0-8194-7398-7Conference Proceedings

A Cube Splitter Interferometer for Phase Shifting Interferometry and Birefringence AnalysisBHATTACHARVA, K; GHOSH, N.Proceedings of SPIE, the International Society for Optical Engineering. 2008, Vol 7155, pp 71551B.1-71551B.5, issn 0277-786X, isbn 978-0-8194-7398-1 0-8194-7398-7, 2Conference Paper

Enhanced Resolution Methods in Shearography and Holography for Time-Average Vibration MeasurementBORZA, D. N.Proceedings of SPIE, the International Society for Optical Engineering. 2008, Vol 7155, pp 715508.1-715508.11, issn 0277-786X, isbn 978-0-8194-7398-1 0-8194-7398-7, 2Conference Paper

Optical Bi-Sensorial Measurement System for Production Control of Extruded ProfilesWECKENMANN, A; BERNSTEIN, J.Proceedings of SPIE, the International Society for Optical Engineering. 2008, Vol 7155, pp 71551U.1-71551U.8, issn 0277-786X, isbn 978-0-8194-7398-1 0-8194-7398-7, 2Conference Paper

The comparison of different temporal phase analysis algorithms in optical dynamic measurementMIAO, H; FU, Y.Proceedings of SPIE, the International Society for Optical Engineering. 2008, Vol 7155, pp 715518.1-715518.10, issn 0277-786X, isbn 978-0-8194-7398-1 0-8194-7398-7, 2Conference Paper

Comparison of Digital Holographic Microscope and Confocal Microscope methods for characterization of micro-optical diffractive componentsYAN HAO; ASUNDI, Anand.Proceedings of SPIE, the International Society for Optical Engineering. 2008, Vol 7155, pp 71550B.1-71550B.10, issn 0277-786X, isbn 978-0-8194-7398-1 0-8194-7398-7, 2Conference Paper

Experimental Study of Unconveniant Static and Dynamic Deformations of Piezoelectric ActuatorsBORZA, D. N.Proceedings of SPIE, the International Society for Optical Engineering. 2008, Vol 7155, pp 71550F.1-71550F.10, issn 0277-786X, isbn 978-0-8194-7398-1 0-8194-7398-7, 2Conference Paper

Characterization of optical surfaces for the present generations of synchrotron sourcesTHOMASSET, M; POLACK, F.Proceedings of SPIE, the International Society for Optical Engineering. 2008, Vol 7155, pp 715506.1-715506.12, issn 0277-786X, isbn 978-0-8194-7398-1 0-8194-7398-7, 2Conference Paper

Phase Shift Polarimetry for non-invasive detection of laser-induced damageWANG PIN; ASUNDI, Anand.Proceedings of SPIE, the International Society for Optical Engineering. 2008, Vol 7155, pp 715511.1-715511.8, issn 0277-786X, isbn 978-0-8194-7398-1 0-8194-7398-7, 2Conference Paper

Speckle Noise Suppression in Shape and Deformation Measurements by Phase-shifting Digital HolographyYAMAGUCHI, Ichirou.Proceedings of SPIE, the International Society for Optical Engineering. 2008, Vol 7155, pp 71551D.1-71551D.9, issn 0277-786X, isbn 978-0-8194-7398-1 0-8194-7398-7, 2Conference Paper

Application of plate vibration and DSPI in evaluation of elastic modulusKUMAR, Rajesh; SHAKHER, Chandra.Proceedings of SPIE, the International Society for Optical Engineering. 2008, Vol 7155, pp 71550U.1-71550U.8, issn 0277-786X, isbn 978-0-8194-7398-1 0-8194-7398-7, 2Conference Paper

Hardware Based Error compensation in 3D Optical Metrology SystemsHARDING, Kevin.Proceedings of SPIE, the International Society for Optical Engineering. 2008, Vol 7155, pp 715505.1-715505.9, issn 0277-786X, isbn 978-0-8194-7398-1 0-8194-7398-7, 2Conference Paper

Infrared of thin film graphene in a magnetic field and the Hall effectSHRIVASTAVA, Keshav N.Proceedings of SPIE, the International Society for Optical Engineering. 2008, Vol 7155, pp 71552F.1-71552F.8, issn 0277-786X, isbn 978-0-8194-7398-1 0-8194-7398-7, 2Conference Paper

Fast wavefront estimation using multiple directional derivatives and quadrature transformLEGARDA-SAENZ, Ricardo.Proceedings of SPIE, the International Society for Optical Engineering. 2008, Vol 7155, pp 715531.1-715531.8, issn 0277-786X, isbn 978-0-8194-7398-1 0-8194-7398-7, 2Conference Paper

Some answers to new challenges in optical metrologyOSTEN, W.Proceedings of SPIE, the International Society for Optical Engineering. 2008, Vol 7155, issn 0277-786X, isbn 978-0-8194-7398-1 0-8194-7398-7, Part I, 715503.1-715503.16, 2Conference Paper

A Double-Prism Lateral Shear Interferometer for Wavefront Analysis and Collimation TestingHII, K. U; KWEK, K. H.Proceedings of SPIE, the International Society for Optical Engineering. 2008, Vol 7155, pp 71551A.1-71551A.8, issn 0277-786X, isbn 978-0-8194-7398-1 0-8194-7398-7, 2Conference Paper

Application research of spectrum measurement technology in thin-film thickness wideband monitoring systemHAN JUN; SHANG, Xiao-Yan; AN, Yu-Ying et al.Proceedings of SPIE, the International Society for Optical Engineering. 2008, Vol 7155, pp 71553A.1-71553A.10, issn 0277-786X, isbn 978-0-8194-7398-1 0-8194-7398-7, 2Conference Paper

Determination of Flatness on Patterned Wafer Surfaces Using Wave-front Sensing MethodsNUTSCH, A; PFITZNER, L; GRANDIN, T et al.Proceedings of SPIE, the International Society for Optical Engineering. 2008, Vol 7155, pp 71550Z.1-71550Z.12, issn 0277-786X, isbn 978-0-8194-7398-1 0-8194-7398-7, 2Conference Paper

Development of a metrological atomic force microscope for nano-scale standards calibrationWANG, S. H; XU, G; TAN, S. L et al.Proceedings of SPIE, the International Society for Optical Engineering. 2008, Vol 7155, pp 71550I.1-71550I.8, issn 0277-786X, isbn 978-0-8194-7398-1 0-8194-7398-7, 2Conference Paper

Frequency-shifting method for phase retrieval from fringe patternsWANG HAIXIA; QIAN KEMAO; GAO WENJING et al.Proceedings of SPIE, the International Society for Optical Engineering. 2008, Vol 7155, pp 71550N.1-71550N.6, issn 0277-786X, isbn 978-0-8194-7398-1 0-8194-7398-7, 2Conference Paper

Full-field swept-source optical coherence tomography with Gaussian spectral shapingSATISH KUMAR DUBEY; SHEORAN, Gyanendra; ANNA, Tulsi et al.Proceedings of SPIE, the International Society for Optical Engineering. 2008, Vol 7155, pp 71551F.1-71551F.8, issn 0277-786X, isbn 978-0-8194-7398-1 0-8194-7398-7, 2Conference Paper